Parameters and available particles

LLC “SPE “Detector” has its own measuring and testing equipment, including a certified heavy ion test complex, for research and testing of microelectronic components

IonDUT energy, MeVM/QRange, µm (Si)LET, MeV/(mg/cm²)
209Bi6683,242,798,6
132Xe501,63,84169,2
959,647,277164
1644,7212,46121,1254,31
84Kr260,43,134,140,6
6778,0682,2733,9
94511,25118,6629,69
56Fe2384,2540,6726
40Ar1283,233,8616,1
305,27,6391,0411,29
388,49,71124,979,9
20Ne663,336,916,67
159,47,97104,354,26
181,49,07155,643,52
264,213,21252,682,79
16O533,3140,464,5
12C128,7610,73276,21,2
Beam parameters:
Flux Maximal limit to 105 part/s.cm2
Homogeneity +/- 20% has been measured over 180mm in the horizontal direction and over 60 mm in the vertical direction
Different types vacuum connectors:
H+S 34 BNC-50-0-6/100 NE – 12 pcs., 34_SHV-50-0-3/100_NE – 4 pcs., CF40-USB2.0-FF-GC-CBG – 2 pcs.,
and two types Russian connectors: РСГСП50-В – 8 pcs., РСГСП19-В – 2 pcs.
5 simple vacuum connectors (DN100) located along the radius of the chamber.
Work at the facilities is carried out within the framework of test sessions lasting 2-3 weeks. The beam time planning is defined every six months.
If you want to reserve a period, please contact us to email info@nppdetector.ru