Parameters and available particles
LLC “SPE “Detector” has its own measuring and testing equipment, including a certified heavy ion test complex, for research and testing of microelectronic components
|Ion||DUT energy, MeV||M/Q||Range, µm (Si)||LET, MeV/(mg/cm²)|
Flux Maximal limit to 105 part/s.cm2
Homogeneity +/- 20% has been measured over 180mm in the horizontal direction and over 60 mm in the vertical direction
Different types vacuum connectors:
H+S 34 BNC-50-0-6/100 NE – 12 pcs., 34_SHV-50-0-3/100_NE – 4 pcs., CF40-USB2.0-FF-GC-CBG – 2 pcs.,
and two types Russian connectors: РСГСП50-В – 8 pcs., РСГСП19-В – 2 pcs.
5 simple vacuum connectors (DN100) located along the radius of the chamber.
Work at the facilities is carried out within the framework of test sessions lasting 2-3 weeks. The beam time planning is defined every six months.
If you want to reserve a period, please contact us to email email@example.com